Staubli Spring Loaded Test Probe, 4mm Tip, 1kV, 4mm Socket, 32A
Technical Document
Specifications
Brand
StaubliVoltage Rating
1kV
Current Rating
32A
Colour
Red
Probe Tip Type
Spring Loaded
Tip Size
4mm
Probe Socket Diameter
4mm
Maximum Operating Temperature
+80°C
Minimum Operating Temperature
-10°C
Country of Origin
Germany
Product details
20A Short Reach Probe
Rigid, short reach probe that accepts 4mm plugs. The tip includes a 4mm Multilam® plug to mate with any 4mm socket.
Handle guard is chamfered on one side for close side-by-side plugging of the probes
Handle includes a non slip fluted grip
Rated at 1000V CAT II 20A
Supplied with
a protective cap.
Warning
These test probes should NOT be used for testing circuits of more than 50Vac, unless specified otherwise. When live circuits are tested, under no circumstances should the fuse rating exceed the quoted rating of any of the test probes.
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₹ 597.76
Each (Exc. GST)
₹ 705.36
Each (inc. GST)
1
RS Components & Controls (I) Ltd
Distribution hub - B-89, Sector 67, Noida, Gautam Budh Nagar, (Uttar Pradesh), 201 301
₹ 597.76
Each (Exc. GST)
₹ 705.36
Each (inc. GST)
1
Buy in bulk
| quantity | Unit price |
|---|---|
| 1 - 4 | ₹ 597.76 |
| 5 - 9 | ₹ 517.49 |
| 10+ | ₹ 507.14 |
Technical Document
Specifications
Brand
StaubliVoltage Rating
1kV
Current Rating
32A
Colour
Red
Probe Tip Type
Spring Loaded
Tip Size
4mm
Probe Socket Diameter
4mm
Maximum Operating Temperature
+80°C
Minimum Operating Temperature
-10°C
Country of Origin
Germany
Product details
20A Short Reach Probe
Rigid, short reach probe that accepts 4mm plugs. The tip includes a 4mm Multilam® plug to mate with any 4mm socket.
Handle guard is chamfered on one side for close side-by-side plugging of the probes
Handle includes a non slip fluted grip
Rated at 1000V CAT II 20A
Supplied with
a protective cap.
Warning
These test probes should NOT be used for testing circuits of more than 50Vac, unless specified otherwise. When live circuits are tested, under no circumstances should the fuse rating exceed the quoted rating of any of the test probes.